Road towards a stress test: stressing the digital twin with current measurements and future loads

This paper presents a methodology used by ewz, to conduct a stress test in the low-voltage grid with the aim to proactively analyse the potential effects of the evolving energy strategy. In short, the objective is to find future weaknesses in our grid by using our digital twin and increasing dimensions like penetration of e-mobility and PV according to our forecasts to find the weakest components in the grid. Within this test a year-by-year analysis of the low voltage grid is performed, bridging the gap between today's loads in the grid to the expected future loads by 2050. This approach allows for the evaluation of future load effects on the low-voltage grid, enabling analysis of potential shortcomings and their temporal occurrence.

Authors

Publication Details

Journal
IET conference proceedings.
Published
2025-01-01
DOI
https://doi.org/10.1049/icp.2024.1959
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
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article

Road towards a stress test: stressing the digital twin with current measurements and future loads

Raffael La Fauci, Jonas Wäfler, Sara Engeler, Joé Wengler
IET conference proceedings.
Integrated Circuits and Semiconductor Failure Analysis
article

Road towards a stress test: stressing the digital twin with current measurements and future loads

Raffael La Fauci, Jonas Wäfler, Sara Engeler, Joé Wengler
article en

Abstract

This paper presents a methodology used by ewz, to conduct a stress test in the low-voltage grid with the aim to proactively analyse the potential effects of the evolving energy strategy. In short, the objective is to find future weaknesses in our grid by using our digital twin and increasing dimensions like penetration of e-mobility and PV according to our forecasts to find the weakest components in the grid. Within this test a year-by-year analysis of the low voltage grid is performed, bridging the gap between today's loads in the grid to the expected future loads by 2050. This approach allows for the evaluation of future load effects on the low-voltage grid, enabling analysis of potential shortcomings and their temporal occurrence.

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Integrated Circuits and Semiconductor Failure Analysis
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