Road towards a stress test: stressing the digital twin with current measurements and future loads
This paper presents a methodology used by ewz, to conduct a stress test in the low-voltage grid with the aim to proactively analyse the potential effects of the evolving energy strategy. In short, the objective is to find future weaknesses in our grid by using our digital twin and increasing dimensions like penetration of e-mobility and PV according to our forecasts to find the weakest components in the grid. Within this test a year-by-year analysis of the low voltage grid is performed, bridging the gap between today's loads in the grid to the expected future loads by 2050. This approach allows for the evaluation of future load effects on the low-voltage grid, enabling analysis of potential shortcomings and their temporal occurrence.
Authors
- Raffael La Fauci
- Jonas Wäfler
- Sara Engeler
- Joé Wengler
Publication Details
- Journal
- IET conference proceedings.
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1049/icp.2024.1959
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00