True Random Number Generator Implemented in ReRAM Crossbar Based on Static Stochasticity of ReRAMs

True Random Number Generators (TRNG) find applications in various fields, especially hardware security. We suggest a TRNG that exploits the intrinsic static stochasticity of Resistive Switching Random Access Memories (ReRAMs) to generate random bits. Other suggested designs use stochasticity in the switching mechanism, which requires high precision over input voltage and time. In the proposed design, the random bits are produced by comparing the resistance of two ReRAMs in their high resistance states. ReRAM crossbar architectures are being highly researched, and our design is completely compatible with a ReRAM crossbar. The design was verified by simulations and testing the output stream using the NIST randomness test suite. The effect of device-to-device variability was tested on the randomness of the generated output bit stream.

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Publication Details

Journal
Advances in Science Technology and Engineering Systems Journal
Published
2024-11-01
DOI
https://doi.org/10.25046/aj090504
Primary Topic
Machine Learning and ELM
Type
article
Field-Weighted Citation Impact
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article

True Random Number Generator Implemented in ReRAM Crossbar Based on Static Stochasticity of ReRAMs

Abhijit Pethe, Tanay Patni
Advances in Science Technology and Engineering Systems Journal
Machine Learning and ELM
article

True Random Number Generator Implemented in ReRAM Crossbar Based on Static Stochasticity of ReRAMs

Abhijit Pethe, Tanay Patni
article en

Abstract

True Random Number Generators (TRNG) find applications in various fields, especially hardware security. We suggest a TRNG that exploits the intrinsic static stochasticity of Resistive Switching Random Access Memories (ReRAMs) to generate random bits. Other suggested designs use stochasticity in the switching mechanism, which requires high precision over input voltage and time. In the proposed design, the random bits are produced by comparing the resistance of two ReRAMs in their high resistance states. ReRAM crossbar architectures are being highly researched, and our design is completely compatible with a ReRAM crossbar. The design was verified by simulations and testing the output stream using the NIST randomness test suite. The effect of device-to-device variability was tested on the randomness of the generated output bit stream.

Advances in Science Technology and Engineering Systems JournalVol. 9(5)
Openalex Percentile: Top 77%
Machine Learning and ELM
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