Life prediction of O-ring with accelerated performance degradation equation

This article first conducts artificial accelerated aging tests on O-ring seals based on the principle of time-temperature equivalence, obtaining the compression permanent deformation rates of fluorine rubber, nitrile rubber, and ethylene propylene rubber O-rings under different experimental conditions. Subsequently, an aging kinetics equation is established to describe the relationship between aging parameters and aging time. This equation is used to determine the aging reaction rate at the corresponding accelerated aging temperature, to extrapolate the aging reaction rate at the actual usage or storage temperature, and to calculate the lifespan based on a given failure threshold. Finally, based on accelerated degradation data, a reliability evaluation method is used to describe the distribution pattern of the overall product life using statistical distribution.

Authors

Publication Details

Journal
IET conference proceedings.
Published
2025-01-01
DOI
https://doi.org/10.1049/icp.2024.3433
Primary Topic
Fault Detection and Control Systems
Type
article
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article

Life prediction of O-ring with accelerated performance degradation equation

Chuanpeng Wang, Yucheng Zhang, Zhan Li
IET conference proceedings.
Fault Detection and Control Systems
article

Life prediction of O-ring with accelerated performance degradation equation

Chuanpeng Wang, Yucheng Zhang, Zhan Li
article en

Abstract

This article first conducts artificial accelerated aging tests on O-ring seals based on the principle of time-temperature equivalence, obtaining the compression permanent deformation rates of fluorine rubber, nitrile rubber, and ethylene propylene rubber O-rings under different experimental conditions. Subsequently, an aging kinetics equation is established to describe the relationship between aging parameters and aging time. This equation is used to determine the aging reaction rate at the corresponding accelerated aging temperature, to extrapolate the aging reaction rate at the actual usage or storage temperature, and to calculate the lifespan based on a given failure threshold. Finally, based on accelerated degradation data, a reliability evaluation method is used to describe the distribution pattern of the overall product life using statistical distribution.

IET conference proceedings.Vol. 2024(12)
Zero hunger
Openalex Percentile: Top 100%
Fault Detection and Control Systems
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Life prediction of O-ring with accelerated performance degradation equation — Chuanpeng Wang, Yucheng Zhang, et al. · IET conference proceedings. (2025) | TGRS Research Map | TGRS