Reliability evaluation of fuzz button contacts with random initial values

Fuzz button contacts are a novel type of electrical contact device, primarily used for connections between printed circuit boards within chassis or modules, as well as between printed circuits boards and chips. However, variability in the production process introduces significant variability in the initial values, which substantially influences their reliability assessment.At present, there are few studies on the reliability evaluation of fuzz button contacts in domestic and foreign literature. In this paper, the influence of high temperature environment on the properties of fuzz button contacts was studied by experiment. Afte r the experiment, the pressing force of fuzz button contacts decreased and the length became shorter. Based on this paper, a Wiener process model with random initial value is proposed, the nonlinear degradation data is linearly converted by using the time - scale transformation model, and the relation between sample lifetimes and high temperature is described by using Arrhenius model. With the maximum likelihood estimation (MLE) method, the model parameters are estimated by integral statistics of all performance degradation data, and the reliability of fuzz button contacts is predicted success.