STUDY OF THE STRUCTURE OF DISPERSED MICROSILICA

This article presents experimental data on the study of the fine structure of dispersed microsilicas: surface topography, morphology of their particles. For this purpose, a multifunctional scanning electron microscope Quanta 200 i3DFEI was used, which allows viewing the details of the structure of porous associates of micrometer sizes, as well as nanometer-level particles. A detailed analysis of the obtained microphotographs allows tracing the structure of the hierarchical organization of particles of amorphous silicon dioxide and condensed microsilica. For a more accurate determination of the elemental composition of dispersed microsilicas, an ARLPerform`X 4200 X-ray fluorescence spectrometer was used, which allows obtaining information on the elemental composition of a significant volume of the object under study.