IC-LOGO: A Custom Dataset and Benchmark for Integrated Circuit Logo Detection Task
In order to enable computers to automatically detect the logo information of Integrated Circuit (IC) images and assist users in searching for the required IC manufacturer information based on the logo images, this article conducted research and analysis on the existing public datasets in the field of logo detection, and found that the existing public datasets cannot meet the specific research and application needs of this article. Therefore, the Integrated Circuit Logo (IC-LOGO) image dataset is presented in this article. The dataset contains 971 internal logo images from 17 manufacturers and 2091 external logo images from 30 manufacturers. Furthermore, the logo images were precisely positioned and annotated. Finally, a benchmark containing 8 different object detection networks was used to test the IC-LOGO dataset. The results show that all detectors trained on the dataset could detect the region and category of LOGO precisely and robustly.
Authors
- Yue Zhao (ORCID: https://orcid.org/0000-0002-4896-2247)
- Qiuzhen Zhang
- Jun Luo (ORCID: https://orcid.org/0000-0002-7651-7423)
- Zhizhe Wang (ORCID: https://orcid.org/0000-0002-5907-1669)
Institutions
- China Electronic Product Reliability and Environmental Test Institute (CN)
Publication Details
- Published
- 2024-11-28
- DOI
- https://doi.org/10.1109/icaica63239.2024.10823001
- Primary Topic
- Handwritten Text Recognition Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00