Optical nonlinear refractive index measurements of Cr <sub>2</sub> Te <sub>3</sub> with an immense photothermal effect
In this work, the optical nonlinearity of PVD-grown Cr 2 Te 3 thin films of 33- and 100-nm thickness with an immense thermal optical effect was investigated.
Authors
- J. Lan (ORCID: https://orcid.org/0000-0003-0121-4142)
- Chao-Kuei Lee
- In Hak Lee
- Kyungtaek Lee (ORCID: https://orcid.org/0000-0002-1310-1391)
- Yeong Gwang Khim (ORCID: https://orcid.org/0000-0001-8365-0137)
- Bo‐Yi Chen (ORCID: https://orcid.org/0000-0001-7185-5370)
- Young Jun Chang (ORCID: https://orcid.org/0000-0001-5538-0643)
- Jeong Hyeon Lee (ORCID: https://orcid.org/0000-0002-5929-5734)
- Mu-Hsuan Tsai
Institutions
- University of Seoul (KR)
- National Sun Yat-sen University (TW)
Publication Details
- Journal
- Materials Advances
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1039/d4ma00946k
- Citations
- 3
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 2.19
Funders
- National Research Foundation
- University of Seoul
- Ministry of Land, Infrastructure and Transport
- National Research Foundation of Korea
- National Science and Technology Council