Detection of Peak Intensity Using an Integrated Optical Modeling Method for Identifying Defective Apple Leaves

The identification of defects in apple leaf specimens is crucial for mitigating crop loss and maintaining harvest quality. This study investigates the applicability of an intensity detection simulation-integrated optical cross-sectional modeling method for detecting defective apple leaf specimens. The technique utilizes a customized 840 nm optical coherence tomography (OCT). The method involved using a peak-intensity detection technique to analyze OCT signal intensity variations in multi-layered leaf structures. Results demonstrate the potential of the method to identify morphological differences between leaf specimens from healthy and infected trees and, specifically, healthy leaf specimens from infected trees. Implementing this method enables cost saving through timely interventions to reduce the impact of leaf defects on crop production.

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Published
2024-11-26
DOI
https://doi.org/10.3390/ecsa-11-20515
Primary Topic
Spectroscopy and Chemometric Analyses
Type
article
Field-Weighted Citation Impact
0.00

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article

Detection of Peak Intensity Using an Integrated Optical Modeling Method for Identifying Defective Apple Leaves

Hana Mohamed, Bhagya Nathali Silva, Sangyeob Han, Daewoon Seong et al.
Spectroscopy and Chemometric Analyses
article

Detection of Peak Intensity Using an Integrated Optical Modeling Method for Identifying Defective Apple Leaves

Hana Mohamed, Bhagya Nathali Silva, Sangyeob Han, Daewoon Seong, Tharindu D. Kalupahana, Udaya Wijenayake, Mansik Jeon, Nipun Shantha Kahatapitiya, Ruchire Eranga Wijesinghe, Jeehyun Kim
article en

Abstract

The identification of defects in apple leaf specimens is crucial for mitigating crop loss and maintaining harvest quality. This study investigates the applicability of an intensity detection simulation-integrated optical cross-sectional modeling method for detecting defective apple leaf specimens. The technique utilizes a customized 840 nm optical coherence tomography (OCT). The method involved using a peak-intensity detection technique to analyze OCT signal intensity variations in multi-layered leaf structures. Results demonstrate the potential of the method to identify morphological differences between leaf specimens from healthy and infected trees and, specifically, healthy leaf specimens from infected trees. Implementing this method enables cost saving through timely interventions to reduce the impact of leaf defects on crop production.

University of Sri Jayewardenepura (LK), Sri Lanka Institute of Information Technology (LK), Kyungpook National University (KR)
University of Sri Jayewardenepura, Division of Human Resource Development
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Spectroscopy and Chemometric Analyses
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Detection of Peak Intensity Using an Integrated Optical Modeling Method for Identifying Defective Apple Leaves — Hana Mohamed, Bhagya Nathali Silva, et al. · (2024) | TGRS Research Map | TGRS