OHMIC Resistance Measurement

The procedure for measuring relatively high ohmic resistance (RHR) is shown. The indirect method is used, which allows determining the best estimate of the magnitude of an ohmic resistance. This procedure is an alternative to make an exact estimate of the magnitude of a resistance. greater than 10 Ω. Starting from Ohm's law, the mathematical model is developed that considers the readings of voltmeter, ammeter and thermometer; this model implies correction for temperature at 20 °C of the measured magnitude. In addition, an experimental example is shown, the magnitude obtained is compared against the measurement made with a Wheatstone bridge.

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Publication Details

Journal
The International Journal of Engineering and Science
Published
2024-12-01
DOI
https://doi.org/10.9790/1813-13123741
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
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article

OHMIC Resistance Measurement

Melissa Muñoz, Manuel Torres Sabino, Yoram Astudillo Baza
The International Journal of Engineering and Science
Semiconductor materials and devices
article

OHMIC Resistance Measurement

Melissa Muñoz, Manuel Torres Sabino, Yoram Astudillo Baza
article en

Abstract

The procedure for measuring relatively high ohmic resistance (RHR) is shown. The indirect method is used, which allows determining the best estimate of the magnitude of an ohmic resistance. This procedure is an alternative to make an exact estimate of the magnitude of a resistance. greater than 10 Ω. Starting from Ohm's law, the mathematical model is developed that considers the readings of voltmeter, ammeter and thermometer; this model implies correction for temperature at 20 °C of the measured magnitude. In addition, an experimental example is shown, the magnitude obtained is compared against the measurement made with a Wheatstone bridge.

The International Journal of Engineering and ScienceVol. 13(12)
Openalex Percentile: Top 77%
Semiconductor materials and devices
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