Strategic DFT Implementation and Verification of Next–Gen Electronics Using ATPG Simulation

In modern nanometer (nm) technology, the significance of Design for Testability (DFT) has increased due to the growing complexity and miniaturization of integrated circuits (ICs). DFT methodologies enable the design and manufacturing of ICs with built-in test structures that facilitate easier and more accurate testing, thus ensuring higher yield, reliability, and performance. DFT techniques like scan chains, Built-in Self-Test (BIST), and boundary scan, are instrumental in detecting and diagnosing manufacturing defects and ensuring robust fault coverage. ATPG algorithms generate test vectors that are used to validate the structural testing of ICs under various conditions, including the worst-case delay scenarios. By simulating test vectors at zero delay and SDF corners ensures that the structural verification of the design. EDA tools are used for the pattern generation & simulations respectively. By using the effective DFT techniques and ATPG simulations it provides fault coverage of stuck-at & transition faults for the entire chip around 99.14% and 97.51 %