Design and Testing of Low Power Cache Memory

In Integrated Circuit (IC) design, low-power cache memory with dft and scan chain techniques is essential for ensuring efficient and reliable operation. These techniques integrate testing capabilities directly into the cache memory, eliminating the need for external test equipment and enabling automatic testing. This approach is cost-effective and crucial for maintaining the quality and reliability of ICs throughout production and their operational lifespan. The benefits of using DFT and scan chains include faster testing, reduced production costs, improved product reliability, and enhanced manufacturing efficiency. The implementation of low-power techniques, including clock gating, resulted in a significant power reduction. The total power of the proposed Low Power Cache Memory design is 20% less than the standard Cache Memory Design. Simulations and synthesis were conducted using Cadence Genus, with physical design and verification completed using Cadence Innovus. Further efficiency gains could be achieved by adopting advanced low-power design methods and integrating machine learning for dynamic power management and adaptive testing in the cache memory.