Modeling of Electromagnetic Disturbance Characteristics of Bus Network Protocol Chip

The study introduces a quantitative model that primarily endeavors to analyze and forecast the conducted emission behaviors of several archetypal digital devices. Through rigorous testing of the conducted emissions from representative digital chips, a model for the conducted emissions of digital integrated circuit chips is constructed, drawing upon the test outcomes. The Power Delivery Network model is acquired employing vector fitting techniques, whereas the chip's internal source model is deduced via indirect measurement methods. The comparative analysis reveals that the quantitative model's error margin remains within 3dB of the actual measured data, demonstrating its high degree of accuracy.