Intelligent Integrated Circuit Testing (IICT) based on CCD Remote Sensing Image Analysis

The study introduces and analyzes a novel methodology called Intelligent Integrated Circuit Testing (IICT) based on CCD remote sensing image analysis. This approach combines the inherent advantages of the NAND flash model, including non-volatility, cost-effectiveness, and high storage capacity. It is crucial in modern mobile devices and digital cameras with the idea of integrating CCD image analysis. This study aims to improve the reliability and efficiency of NAND flash test approaches.The test framework involves generating test vectors through scan chains connected to each system bit, which ensures comprehensive node toggling within the circuit over precise clock cycles. This novel approach facilitates thorough testing of internal nodes, which is critical for detecting and mitigating common NAND flash failures. The key parameters considered are Wordline Erase Disturb (WED), Bitline Erase Disturb (BED), Wordline Program Disturb (WPD), Bitline Program Disturb (BPD), Over-Erase Disturb (OED), and OverProgram Disturb (OPD). Experimental analysis demonstrates significant occurrence of these disturbances, the results highlight the need for robust testing methodologies to the real applications.