Gaussian Feature Analysis for Fault Management in CV-QKD Coexisting with Classical Channels
Faults in CV-QKD systems coexisting with classical channels can impact CV-QKD performance. We characterize several failure causes and propose effective algorithms to perform fault detection, severity estimation for preventive maintenance, and identification of probable failures.
Authors
- Masab Iqbal (ORCID: https://orcid.org/0000-0002-6339-1542)
- Laia Nadal (ORCID: https://orcid.org/0000-0003-0798-6370)
- Michela Svaluto Moreolo (ORCID: https://orcid.org/0000-0001-6859-2573)
- Raül Muñoz (ORCID: https://orcid.org/0000-0003-4651-4499)
Institutions
- Centre Tecnologic de Telecomunicacions de Catalunya (ES)
Publication Details
- Published
- 2024-11-02
- DOI
- https://doi.org/10.1109/acp/ipoc63121.2024.10809906
- Citations
- 1
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.49