Digital Chip Susceptibility Assessment and Level Classification via the DPI Approach

As the feature size of integrated circuits continues to shrink and the working environment becomes more complex and variable, their electromagnetic susceptibility directly affects the electromagnetic compatibility performance of the entire electronic device. This paper conducts a test and analysis of conducted electromagnetic susceptibility for digital integrated circuits based on the Direct Power Injection (DPI) method proposed in IEC 62132-4. The electromagnetic susceptibility levels of integrated circuits are systematically summarized, providing clear susceptibility judgment criteria for related experiments. A detailed assessment of the electromagnetic susceptibility of different pins of the same integrated circuit is carried out to comprehensively measure its overall anti-interference capability. A comparative analysis of the susceptibility threshold levels of integrated circuits is conducted. Through testing and analysis, it is found that digital power pins have stronger anti-interference capabilities compared to other functional pins, while output and reset control pins are more susceptible. In practical use environments, it is necessary to add necessary protection to ensure the normal operation of digital devices.