Measuring Third-Order Nonlinear Susceptibility in Silicon Nitride Resonator Based on DC Kerr Effect

We use an efficient measurement technique for measuring polarization-dependent third-order nonlinearity in silicon nitride integrated waveguides with CW excitations. We recorded a third-order nonlinear susceptibility of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(0.40\pm 0.07)\times 10^{-21}m^{2}/V^{2}$</tex> for TM mode

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Published
2024-11-02
DOI
https://doi.org/10.1109/acp/ipoc63121.2024.10809909
Citations
1
Primary Topic
Mechanical and Optical Resonators
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article
Field-Weighted Citation Impact
0.34
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article

Measuring Third-Order Nonlinear Susceptibility in Silicon Nitride Resonator Based on DC Kerr Effect

Kambiz Jamshidi, Menglong He, Abdou Shetewy
1 citations
Mechanical and Optical Resonators
0.34
article

Measuring Third-Order Nonlinear Susceptibility in Silicon Nitride Resonator Based on DC Kerr Effect

Kambiz Jamshidi, Menglong He, Abdou Shetewy
article en
1 citations

Abstract

We use an efficient measurement technique for measuring polarization-dependent third-order nonlinearity in silicon nitride integrated waveguides with CW excitations. We recorded a third-order nonlinear susceptibility of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(0.40\pm 0.07)\times 10^{-21}m^{2}/V^{2}$</tex> for TM mode

Technische Universität Dresden (DE)
Affordable and clean energy
Openalex Percentile: Top 37%
Mechanical and Optical Resonators
0.34
DOISourceOpenAlex
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Measuring Third-Order Nonlinear Susceptibility in Silicon Nitride Resonator Based on DC Kerr Effect — Kambiz Jamshidi, Menglong He, et al. · (2024) | TGRS Research Map | TGRS