Analysis and Testing of Conducted Electromagnetic Susceptibility in Integrated Circuits Based on Multi-Waveform Interference Using BCI
This paper integrates a Bulk Current Injection (BCI) probe with various types of interference signals to design a multi-waveform interference-based BCI conducted electromagnetic susceptibility (EMS) test for integrated circuits. This paper analyzes the impact of different types of interference signals on the susceptibility of integrated circuits according to the results of conducted electromagnetic susceptibility testing.
Authors
- Siyi Xing (ORCID: https://orcid.org/0009-0007-2456-0546)
- Kunkun Hu (ORCID: https://orcid.org/0000-0002-7168-5823)
- Changshun Fu (ORCID: https://orcid.org/0000-0001-8575-9662)
- Zhaowen Yan (ORCID: https://orcid.org/0000-0003-0994-7578)
- Ying Chen (ORCID: https://orcid.org/0000-0002-6527-4251)
- Fuyu Zhao (ORCID: https://orcid.org/0000-0002-0625-068X)
Institutions
- Beihang University (CN)
Publication Details
- Published
- 2024-11-27
- DOI
- https://doi.org/10.1109/mape62875.2024.10813969
- Primary Topic
- Engineering and Test Systems
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China