Semiconductor Laser Chip Far-Field Divergence Angle Measurement
A method for measuring the far-field divergenceangle of a semiconductor laser-chip is proposed. Experiments show that the proposed method yields high precision through measurements of a SMF and a lensed-fiber, followed by semiconductor laser chips.
Authors
- Qiaoyin Lu (ORCID: https://orcid.org/0000-0001-6671-8929)
- Weihua Guo (ORCID: https://orcid.org/0000-0001-5634-1048)
- Yuanhao Zhang (ORCID: https://orcid.org/0000-0003-3448-8924)
- C.Z. Shi
Institutions
- Wuhan National Laboratory for Optoelectronics (CN)
- Huazhong University of Science and Technology (CN)
Publication Details
- Published
- 2024-11-02
- DOI
- https://doi.org/10.1109/acp/ipoc63121.2024.10809953
- Primary Topic
- Semiconductor Lasers and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00