Single-event Effect Simulation Platform for Space Processors
In the space environment, space processors are highly susceptible to single-event effects that can flip or latch the contents of logic units in the processor, leading to processor failure. Before carrying out processor fault-tolerant design, an in-depth single-event sensitivity analysis is required, especially to simulate the behavioral characteristics of the processor in the presence of single-event effects. To address this need, this paper presents a single-event effect simulation platform for SPARC architecture processor models. The platform adopts the Unified Command-line Interface to simulate the single event effect in the operation of the space processor, and makes use of Makefile and Python to realize the automatic injection of faults caused by the single event effect; by loading the test cases simulating the single event effect, it simulates the single event effect during the operation of the space processor, and optimizes the simulation flow so as to reduce the simulation time.
Authors
- Hua Yang (ORCID: https://orcid.org/0000-0001-5012-0594)
- Shi‐Yuan Zhang (ORCID: https://orcid.org/0000-0002-7199-2938)
- Wei Zhuang (ORCID: https://orcid.org/0000-0002-2470-7268)
- Yuan Wang (ORCID: https://orcid.org/0000-0002-5215-0487)
- Lei Chen (ORCID: https://orcid.org/0000-0002-9612-4408)
- Daming Yang
Institutions
- Peking University (CN)
- Beijing Microelectronics Technology Institute (CN)
Publication Details
- Published
- 2024-10-25
- DOI
- https://doi.org/10.1109/icicm63644.2024.10814161
- Citations
- 1
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.21