Distributed Self-Interleaving PWM Signals With Fault-Tolerant Capability for High-Performance Microprocessor Power Supply in Aerospace
In this article, we introduce a novel distributed self-interleaving management solution with enhanced noise immunity for multiphase converters applications. This solution, in conjunction with a distributed local decision self-monitoring circuit, has the potential to increase the functional safety and availability of microprocessor power supplies in aerospace. In the literature, most recent distributed control technique for interleaving the pulsewidth modulation gating signals of the converter rely on analog carrier-based signals, making it susceptible to external disturbances and noise, especially as the number of phases increases. In response, this article proposes an original distributed self-interleaving method based on a double-input phase-locked loop (2I-PLL) circuit. This approach synchronizes and interleaves oscillators using two logic-level signals where the level transition carries the phase delay information, mitigating analog signal limitations. Studies using modal analysis address challenges such as system stability and dynamic/convergence response. The 2I-PLL method is validated through simulations and experiments, covering scenarios from 4 to 10 phases and switching frequency from 50 kHz to 3 MHz.
Authors
- Marc Cousineau (ORCID: https://orcid.org/0000-0002-2797-365X)
- Miguel Mannes Hillesheim (ORCID: https://orcid.org/0000-0002-6135-7877)
- Gregory Arthur de Almeida Carlos (ORCID: https://orcid.org/0000-0002-7012-3538)
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université Toulouse III - Paul Sabatier (FR)
- Institut National Polytechnique de Toulouse (FR)
- Laboratoire Plasma et Conversion d'Energie (FR)
- Philips (France) (FR)
- École Nationale Supérieure d'Électrotechnique, d'Électronique, d'Informatique, d'Hydraulique et des Télécommunications (FR)
Publication Details
- Journal
- IEEE Transactions on Power Electronics
- Published
- 2024-12-31
- DOI
- https://doi.org/10.1109/tpel.2024.3522857
- Citations
- 1
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.21