High-Frequency Characterization of Optoelectronic Devices by Pilot-Assisted Harmonic Analysis
A high-frequency characterizing method is proposed for measuring frequency response parameters of optoelectronic devices through pilot-assisted harmonic analysis. The frequency response of the electro-optic modulator (EOM) can be extracted by the pilot insertion and extraction fixed at low frequency. The frequency response of the photodetector (PD) can be solved by subtracting the modulation response of EOM from the harmonic components in the photocurrent signal. In the experimental demonstration, an EOM is measured with a fixed-low-frequency pilot signal at 70 MHz, and the frequency response of a commercial PD is evaluated up to 50 GHz by expanding the measuring frequency range up to a 2-fold driving frequency range.
Authors
- Shangjian Zhang (ORCID: https://orcid.org/0000-0001-9131-4002)
- Xinhai Zou (ORCID: https://orcid.org/0000-0002-9755-7010)
- Yong Liu (ORCID: https://orcid.org/0000-0002-2966-7867)
- Junfeng Zhu (ORCID: https://orcid.org/0009-0007-2202-2445)
- Zhiyao Zhang (ORCID: https://orcid.org/0000-0002-7227-5084)
- Ying Xu (ORCID: https://orcid.org/0000-0002-5471-6739)
Institutions
- National Engineering Research Center of Electromagnetic Radiation Control Materials (CN)
Publication Details
- Published
- 2024-08-16
- DOI
- https://doi.org/10.1109/icait62580.2024.10807864
- Primary Topic
- Sensor Technology and Measurement Systems
- Type
- article
- Field-Weighted Citation Impact
- 0.00