Measurements of Induced Voltages on Overhead Distribution Line Due to Altitude-Triggered Lightning
This article presents the measurements of induced voltages at the terminal of an overhead distribution line caused by three altitude-triggered lightning events, consisting of three mini-return strokes and 16 subsequent return strokes. The results indicate that even mini-return strokes can generate significant induced voltages on the overhead line, as one of the mini-return strokes occurring at a distance of 20 m produces a peak value of 37.1 kV. The voltage waveforms predominantly exhibit positive polarity, with a noticeable negative polarity rebound at the end of the descending edge. However, the polarity of the voltage waveform induced by a subsequent return stroke exhibits either bipolar or unipolar characteristics, depending on the location of the lightning relative to the overhead line. During a lightning event, the average 10%–90% rise time of the induced voltage waveforms caused by the subsequent return strokes is slightly less than that of the mini-return stroke. Moreover, compared with the simulation results, the induced voltages are notably influenced by the tortuosity of the lightning channel.
Authors
- Weitao Lyu (ORCID: https://orcid.org/0000-0001-8434-6655)
- Lyuwen Chen (ORCID: https://orcid.org/0000-0001-7165-6275)
- Shaodong Chen (ORCID: https://orcid.org/0000-0002-8789-9826)
- Gaopeng Lu
- Yanfeng Fan (ORCID: https://orcid.org/0000-0001-6173-0937)
- Feng Lu (ORCID: https://orcid.org/0000-0001-6573-2550)
- Xu Yan (ORCID: https://orcid.org/0000-0002-6463-5422)
- Gan Yang (ORCID: https://orcid.org/0009-0008-2177-9785)
Institutions
- University of Science and Technology of China (CN)
- China Meteorological Administration (CN)
- Chinese Academy of Meteorological Sciences (CN)
Publication Details
- Journal
- IEEE Transactions on Electromagnetic Compatibility
- Published
- 2024-12-30
- DOI
- https://doi.org/10.1109/temc.2024.3511938
- Primary Topic
- Lightning and Electromagnetic Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.00