Evaluation of a BSIM4 Model at Cryogenic Temperature Using 65 nm Bulk Transistors
In recent years, to facilitate the scalability of quantum computers, a CMOS circuit system working at cryogenic temperatures (Cryo-CMOS) has been intensively researched for qubit control. However, circuit designers have to make a circuit simulation model for Cryo-CMOS because cryogenic temperatures fall beyond the temperature range officially guaranteed by semiconductor manufacturers. In this study, we model nMOS and pMOS transistors fabricated with a 65nm bulk process at 4K using BSIM4 (Berkeley Short-channel IGFET Model). We demonstrate that our model can simulate the rapid increase in threshold voltage and the steepening of the subthreshold slope, which are characteristically observed in cryogenic environments.
Authors
- Michihiro Shintani (ORCID: https://orcid.org/0000-0002-1163-096X)
- S. Taniguchi
Institutions
- Kyoto Institute of Technology (JP)
Publication Details
- Published
- 2024-11-21
- DOI
- https://doi.org/10.1109/imfedk64776.2024.10814465
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00