Influence of point defects on laser-induced excitation in silicon

We studied the influence of defect states on the laser excitation process in silicon using time-dependent density functional theory. We assumed two types of point defects: interstitial oxygen and silicon vacancies. We found that the photoabsorption efficiency increased with defect density in both cases owing to the color center. These defects distorted the crystal structure, thereby relaxing the selection rules and changing the indirect gap to direct. At low laser intensities, the defect states dominated the absorption process. However, as the laser intensity increased, the excitation efficiency approached that of crystalline silicon. In addition, we observed that the excitation efficiency did not scale linearly with the pulse length. Notably, in the case of <a:math xmlns:a="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><a:mi>Si</a:mi></a:math> vacancies, saturable absorption reduced photoabsorption significantly. Our results suggest that the existence of a defect induces the even-order high-harmonics generation. The enhancement of even-order high-harmonics generation by the silicon vacancy is larger than the interstitial oxygen. Published by the American Physical Society 2024

Authors

Institutions

Publication Details

Journal
Physical Review Applied
Published
2024-12-30
DOI
https://doi.org/10.1103/physrevapplied.22.064096
Citations
3
Primary Topic
Laser Material Processing Techniques
Type
article
Field-Weighted Citation Impact
1.12

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Influence of point defects on laser-induced excitation in silicon

Tomohito Otobe, Eiyu Gushiken
3 citations
Physical Review Applied
Laser Material Processing Techniques
1.12
article

Influence of point defects on laser-induced excitation in silicon

Tomohito Otobe, Eiyu Gushiken
article en
3 citations

Abstract

We studied the influence of defect states on the laser excitation process in silicon using time-dependent density functional theory. We assumed two types of point defects: interstitial oxygen and silicon vacancies. We found that the photoabsorption efficiency increased with defect density in both cases owing to the color center. These defects distorted the crystal structure, thereby relaxing the selection rules and changing the indirect gap to direct. At low laser intensities, the defect states dominated the absorption process. However, as the laser intensity increased, the excitation efficiency approached that of crystalline silicon. In addition, we observed that the excitation efficiency did not scale linearly with the pulse length. Notably, in the case of <a:math xmlns:a="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><a:mi>Si</a:mi></a:math> vacancies, saturable absorption reduced photoabsorption significantly. Our results suggest that the existence of a defect induces the even-order high-harmonics generation. The enhancement of even-order high-harmonics generation by the silicon vacancy is larger than the interstitial oxygen. Published by the American Physical Society 2024

Physical Review AppliedVol. 22(6)
National Institutes for Quantum Science and Technology (JP), The University of Tokyo (JP)
Ministry of Education, Culture, Sports, Science and Technology, University of Tokyo, University of Tsukuba, Japan Society for the Promotion of Science
Affordable and clean energy
Openalex Percentile: Top 24%
Laser Material Processing Techniques
1.12
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Influence of point defects on laser-induced excitation in silicon — Tomohito Otobe, Eiyu Gushiken · Physical Review Applied (2024) | TGRS Research Map | TGRS