CHARACTERIZATION OF SOME WHEAT GENOTYPES BASED ON FLAG LEAF AREA

The study evaluated the leaf area at the flag leaf in a collection of 25 wheat genotypes. The wheat genotypes were cultivated within the ARDS Lovrin, agricultural year 2023 – 2024. Flag leaf samples were randomly taken from each genotype. The determination of the leaf area was done by scanning. The experimental data showed statistical reliability and normal distribution, r = 0.991. High variability was recorded in genotype 5036 (CV = 34.7514), and moderate variability in genotypes 5027, 5030, 5031, 5037, 5042 and 5044 (CV = 23.0228 in genotype 5042 to CV = 25.0292 in genotype 5030). The other genotypes showed low variability, with values ​​CV = 9.6988 (genotype 5035), to CV = 19.5588 (genotype 5043). The calculated mean value (LA_m) at the level of the studied wheat genotypes was LA_m = 27.72 cm2. From the analysis of the results, 11 genotypes presented LA values ​​higher than the experiment mean (LA_m), and 14 genotypes presented values ​​lower than the mean. In the case of 18 comparative analyses, the differences showed statistical certainty, eight positive differences, and 10 negative differences. In the case of seven comparative analyses, the differences did not show statistical certainty (p>0.05). Cluster analysis grouped the genotypes in relation to the recorded LA values ​​(Coph.corr. = 0.737). A ranking of the genotypes was made based on leaf area, coefficient of variation and differences in relation to the mean value.