Development of digital calibration certificates for coordinate metrology applications

Reporting measurement results in a unique digital format is one of the challenges, that is imposed by digitalisation. The Digital Calibration Certificate (DCC) is a promising format that provides a community-independent, machine-readable structure for reporting results. The use of this format for coordinate metrology is presented for a selection of measurement standards that include basic and sophisticated characteristics. The building blocks and techniques of the DCC relevant for the reporting of measurement results in coordinate metrology are presented. Solutions for reporting results for characteristics that are compatible with the existing capabilities of the current DCC schema are discussed. Some challenges for reporting results are presented.

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Publication Details

Journal
Measurement Sensors
Published
2024-12-28
DOI
https://doi.org/10.1016/j.measen.2024.101478
Citations
1
Primary Topic
Manufacturing Process and Optimization
Type
article
Field-Weighted Citation Impact
0.35
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article

Development of digital calibration certificates for coordinate metrology applications

Katharina Janzen, D. Heißelmann
1 citations
Measurement Sensors
Manufacturing Process and Optimization
0.35
article

Development of digital calibration certificates for coordinate metrology applications

Katharina Janzen, D. Heißelmann
article en
1 citations

Abstract

Reporting measurement results in a unique digital format is one of the challenges, that is imposed by digitalisation. The Digital Calibration Certificate (DCC) is a promising format that provides a community-independent, machine-readable structure for reporting results. The use of this format for coordinate metrology is presented for a selection of measurement standards that include basic and sophisticated characteristics. The building blocks and techniques of the DCC relevant for the reporting of measurement results in coordinate metrology are presented. Solutions for reporting results for characteristics that are compatible with the existing capabilities of the current DCC schema are discussed. Some challenges for reporting results are presented.

Measurement SensorsVol. 38
Physikalisch-Technische Bundesanstalt (DE)
Openalex Percentile: Top 32%
Manufacturing Process and Optimization
0.35
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