Standard Cells with Inverted Inputs in 7nm Technology

This paper presents a method to determine which inverted input cells (IICs) should be included into a standard cell library designed with a 7 nm process technology. Standard cells with some inverted inputs not only could reduce the number of cells in a design but also possibly eliminate the area overhead (diffusion breaks) required for isolating the inverters from the standard cells without inverted inputs. Our experimental results show that employing a 7 nm standard cell library with 21 IICs derivedfrom only 8 master cells could save on average 8.4% cells and 2.8% total cell area per circuit without worsening timing performance.

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Publication Details

Published
2024-11-07
DOI
https://doi.org/10.1109/apccas62602.2024.10808879
Primary Topic
VLSI and Analog Circuit Testing
Type
article
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article

Standard Cells with Inverted Inputs in 7nm Technology

Tung-Chun Wu, Rung-Bin Lin
VLSI and Analog Circuit Testing
article

Standard Cells with Inverted Inputs in 7nm Technology

Tung-Chun Wu, Rung-Bin Lin
article en

Abstract

This paper presents a method to determine which inverted input cells (IICs) should be included into a standard cell library designed with a 7 nm process technology. Standard cells with some inverted inputs not only could reduce the number of cells in a design but also possibly eliminate the area overhead (diffusion breaks) required for isolating the inverters from the standard cells without inverted inputs. Our experimental results show that employing a 7 nm standard cell library with 21 IICs derivedfrom only 8 master cells could save on average 8.4% cells and 2.8% total cell area per circuit without worsening timing performance.

Yuan Ze University (TW)
Affordable and clean energy
Openalex Percentile: Top 74%
VLSI and Analog Circuit Testing
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Standard Cells with Inverted Inputs in 7nm Technology — Tung-Chun Wu, Rung-Bin Lin · (2024) | TGRS Research Map | TGRS