Design of Low-Power 6T Adiabatic PUF Circuit
The adiabatic based Physical Unclonable Functions (PUF) is a circuit that utilizes adiabatic technology and the variations in the CMOS manufacturing process to achieve low energy dissipation and enhance device security. In this paper, we propose a low-power 6T adiabatic PUF and simulated using 0.18 $\mu \mathrm{m}$ CMOS process technology. The simulation results show that the proposed PUF achieves an average reliability of $98.51 \%$ against variations of temperature and supply voltage, with a uniqueness of $49.75 \%$ and consumes $15.92 \mathrm{fJ} / \mathrm{Cb}-\mathrm{cycle}$ per bit. To validate the functionality of the proposed PUF, a 4-bit Low-Power 6T PUF chip is fabricated using $0.18 \mu \mathrm{~m}$ standard CMOS process. Measurement results show that the proposed PUF has normal PUF functionality and has an average reliability of $96.92 \%$ at room temperature.
Authors
- Yasuhiro Takahashi (ORCID: https://orcid.org/0000-0002-1653-8425)
- Jiaming Liu (ORCID: https://orcid.org/0000-0002-6619-6443)
Institutions
- Gifu University (JP)
Publication Details
- Published
- 2024-11-07
- DOI
- https://doi.org/10.1109/apccas62602.2024.10808318
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00