3D Digital Compute-in-Memory Benchmark with A5 CFET Technology
Digital compute-in-memory (DCIM) has recently emerged as a promising solution to address the scalability and accuracy challenges in analog CIM (ACIM) for next-generation AI hardware acceleration. In this work, we present a 3D DCIM accelerator design implemented at 5 Angstrom (A5) Complementary FET (CFET) technology node. A novel compact 8T CFET-based DCIM bit cell (6T SRAM+2T AND gate) is proposed over the conventional 10T DCIM bit cell, and its functionality is verified through TCAD simulation. Furthermore, macro-level and system-level power, performance, and area (PPA) performance of the proposed design is evaluated using NeuroSim V1.4, a CIM benchmark framework for leading-edge technology nodes. It was shown that A5 DCIM can achieve approximately 70% higher Figure of merit (FOM) compared to state-of-the-art 1nm DCIM design. Our findings suggest continued scaling benefits by employing CFET technology for the DCIM design.
Authors
- Minji Shon (ORCID: https://orcid.org/0009-0001-5498-037X)
- Junmo Lee (ORCID: https://orcid.org/0000-0001-6092-6436)
- Shimeng Yu (ORCID: https://orcid.org/0000-0002-0068-3652)
Institutions
- Georgia Institute of Technology (US)
Publication Details
- Published
- 2024-11-07
- DOI
- https://doi.org/10.1109/apccas62602.2024.10808252
- Citations
- 3
- Primary Topic
- Advanced Memory and Neural Computing
- Type
- article
- Field-Weighted Citation Impact
- 0.63
Funders
- Samsung