High-Density ROM Design and Optimization Based on 12nm Technology

This article introduces a fully custom design of a high-density ROM, utilizing a 12nm process for microprocessor applications. To achieve objectives of all size, less area, and low power, the ROM circuit was entirely redesigned. Following the circuit design, a comprehensive custom layout was developed, and simulations were conducted to evaluate the read functionality, speed, and power consumption. The design operates use 12nm logical 0.01728um2 ROM cell, within a voltage range of O.7V-1.1V, and demonstrates overall superior performance compared to previous designs.

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Publication Details

Published
2024-11-08
DOI
https://doi.org/10.1109/isceic63613.2024.10810210
Primary Topic
VLSI and Analog Circuit Testing
Type
article
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article

High-Density ROM Design and Optimization Based on 12nm Technology

Xiangyu Kong, Yicheng Zhu, Lijun Zhang
VLSI and Analog Circuit Testing
article

High-Density ROM Design and Optimization Based on 12nm Technology

Xiangyu Kong, Yicheng Zhu, Lijun Zhang
article en

Abstract

This article introduces a fully custom design of a high-density ROM, utilizing a 12nm process for microprocessor applications. To achieve objectives of all size, less area, and low power, the ROM circuit was entirely redesigned. Following the circuit design, a comprehensive custom layout was developed, and simulations were conducted to evaluate the read functionality, speed, and power consumption. The design operates use 12nm logical 0.01728um2 ROM cell, within a voltage range of O.7V-1.1V, and demonstrates overall superior performance compared to previous designs.

Soochow University (CN)
Affordable and clean energy
Openalex Percentile: Top 74%
VLSI and Analog Circuit Testing
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