High-Density ROM Design and Optimization Based on 12nm Technology
This article introduces a fully custom design of a high-density ROM, utilizing a 12nm process for microprocessor applications. To achieve objectives of all size, less area, and low power, the ROM circuit was entirely redesigned. Following the circuit design, a comprehensive custom layout was developed, and simulations were conducted to evaluate the read functionality, speed, and power consumption. The design operates use 12nm logical 0.01728um2 ROM cell, within a voltage range of O.7V-1.1V, and demonstrates overall superior performance compared to previous designs.
Authors
- Xiangyu Kong (ORCID: https://orcid.org/0000-0001-7515-2613)
- Yicheng Zhu (ORCID: https://orcid.org/0000-0001-9442-3044)
- Lijun Zhang (ORCID: https://orcid.org/0000-0002-9547-043X)
Institutions
- Soochow University (CN)
Publication Details
- Published
- 2024-11-08
- DOI
- https://doi.org/10.1109/isceic63613.2024.10810210
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00