A 5-nm 60-GS/s 7b 64-Way Time Interleaved Partial Loop Unrolled SAR ADC Achieving 35.2dB SNDR up to 32 GHz

A 60-GS/s 7b 64-way time interleaved (TI) analog-to-digital converter (ADC) with analog front end (AFE) is described. The presented converter features a non-binary partial loop unrolled (LU) SAR SubADC architecture that leverages multiple comparators, thus enabling better tradeoff between noise and power compared to conventional SAR. Offsets mismatches among comparators of each SubADC are calibrated in background by detecting patterns in the SAR output decisions. This results in no need for any analog hardware reconfigurability or additional phase overhead. Fabricated in 5-nm technology, the prototype AFE and ADC deliver 35.5 and 35.2dB signal to noise and distortion ratio (SNDR) till 20 and 32 GHz, respectively, and draw 109.3 mW from 0.9 V supply.

Authors

Publication Details

Journal
IEEE Journal of Solid-State Circuits
Published
2024-12-27
DOI
https://doi.org/10.1109/jssc.2024.3517333
Citations
7
Primary Topic
Analog and Mixed-Signal Circuit Design
Type
article
Field-Weighted Citation Impact
1.29
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article

A 5-nm 60-GS/s 7b 64-Way Time Interleaved Partial Loop Unrolled SAR ADC Achieving 35.2dB SNDR up to 32 GHz

Ivan Fabiano, Marco Sosio, Domenico Albano, Alessandro Bosi et al.
7 citations
IEEE Journal of Solid-State Circuits
Analog and Mixed-Signal Circuit Design
1.29
article

A 5-nm 60-GS/s 7b 64-Way Time Interleaved Partial Loop Unrolled SAR ADC Achieving 35.2dB SNDR up to 32 GHz

Ivan Fabiano, Marco Sosio, Domenico Albano, Alessandro Bosi, S. Scouten, S. Jantzi, Marco Garampazzi, Leonardo Vignoli, Claudio Nani, Gabriele Minoia, Nicola Codega, Claudio Asero, Enrico Temporiti, Alessio Di Pasquo, Fabio Giunco, Enrico Monaco, N. Ghittori, Paolo Rossi, Leonardo Daniel Herbas Burgos
article en
7 citations

Abstract

A 60-GS/s 7b 64-way time interleaved (TI) analog-to-digital converter (ADC) with analog front end (AFE) is described. The presented converter features a non-binary partial loop unrolled (LU) SAR SubADC architecture that leverages multiple comparators, thus enabling better tradeoff between noise and power compared to conventional SAR. Offsets mismatches among comparators of each SubADC are calibrated in background by detecting patterns in the SAR output decisions. This results in no need for any analog hardware reconfigurability or additional phase overhead. Fabricated in 5-nm technology, the prototype AFE and ADC deliver 35.5 and 35.2dB signal to noise and distortion ratio (SNDR) till 20 and 32 GHz, respectively, and draw 109.3 mW from 0.9 V supply.

IEEE Journal of Solid-State CircuitsVol. 60(4)
Affordable and clean energy
Openalex Percentile: Top 21%
Analog and Mixed-Signal Circuit Design
1.29
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