Direct Measurement of Carrier Distribution in Perovskite by Scanning Capacitance Microscopy

This study successfully applies scanning capacitance microscopy (SCM) to organic–inorganic metal halide perovskite materials, providing detailed insights into the microscopic distribution of carrier concentrations and types. We developed and optimized an alumina (Al2O3) insulating layer using atomic layer deposition, with a 5 nm thickness at 398.15 K proving optimal for minimizing defects at the Al2O3/perovskite interface. Further optimizations included selecting an appropriate probe for high-contrast SCM imaging, reducing stray capacitance by scanning at sample edges, and analyzing the effects of light illumination. Our results show that perovskite films with excess PbI2 in the precursor had a more uniform carrier distribution and higher overall carrier concentration. Additionally, we identified distinct p-type and n-type regions in perovskite materials modified with polar molecular additives. This work enables SCM as a robust technique for investigating complex carrier behaviors in perovskite materials.

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Publication Details

Journal
The Journal of Physical Chemistry C
Published
2024-12-25
DOI
https://doi.org/10.1021/acs.jpcc.4c06178
Citations
3
Primary Topic
Perovskite Materials and Applications
Type
article
Field-Weighted Citation Impact
0.63

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article

Direct Measurement of Carrier Distribution in Perovskite by Scanning Capacitance Microscopy

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The Journal of Physical Chemistry C
Perovskite Materials and Applications
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article

Direct Measurement of Carrier Distribution in Perovskite by Scanning Capacitance Microscopy

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article en
3 citations

Abstract

This study successfully applies scanning capacitance microscopy (SCM) to organic–inorganic metal halide perovskite materials, providing detailed insights into the microscopic distribution of carrier concentrations and types. We developed and optimized an alumina (Al2O3) insulating layer using atomic layer deposition, with a 5 nm thickness at 398.15 K proving optimal for minimizing defects at the Al2O3/perovskite interface. Further optimizations included selecting an appropriate probe for high-contrast SCM imaging, reducing stray capacitance by scanning at sample edges, and analyzing the effects of light illumination. Our results show that perovskite films with excess PbI2 in the precursor had a more uniform carrier distribution and higher overall carrier concentration. Additionally, we identified distinct p-type and n-type regions in perovskite materials modified with polar molecular additives. This work enables SCM as a robust technique for investigating complex carrier behaviors in perovskite materials.

The Journal of Physical Chemistry CVol. 129(1)
Ningbo University (CN), University of Mobile (US), Shanghai Jiao Tong University (CN), Chinese Academy of Sciences (CN), Soochow University (CN), Ningbo Institute of Industrial Technology (CN)
National Natural Science Foundation of China, Ningbo Municipal Bureau of Science and Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences
Affordable and clean energy
Openalex Percentile: Top 30%
Perovskite Materials and Applications
0.63
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