Study on Reliability of Field-Aged Photovoltaic Connectors

The paper presents the reliability study on field-aged photovoltaic connectors of different makes characterized by diverse climatic conditions with 2 to 10 years of operational life. A series of tests conforming to IEC 62852 conducted on field-aged connectors and control samples. The objective is to elucidate the mechanisms of aging and evaluate reliability of connectors, identify failure modes, potential hazards, changes in electrical and mechanical performance because of longstanding exposure to environmental and operational stresses. Field survey and testing reveal lack of awareness of workmanship and maintenance. Laboratory testing reveals connector less than 6 years of life shows low contact resistance and remain stable or have marginal linear increase after thermal and damp heat testing. Samples with life of 6 years or more from extreme climatic regions show high contact resistance with nonlinear pattern increasing to 300% in the thermal cycle and up to 600% in damp heat test. In SEM fretting was observed with high contact resistance with marginal polymer deterioration

Authors

Publication Details

Journal
Eksploatacja i Niezawodnosc - Maintenance and Reliability
Published
2024-12-26
DOI
https://doi.org/10.17531/ein/199496
Citations
1
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.21
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Study on Reliability of Field-Aged Photovoltaic Connectors

Eswaramoorthy Muthusamy, Devendra Goyal, Nikhil PG, K.R. Kapoor
1 citations
Eksploatacja i Niezawodnosc - Maintenance and Reliability
Integrated Circuits and Semiconductor Failure Analysis
0.21
article

Study on Reliability of Field-Aged Photovoltaic Connectors

Eswaramoorthy Muthusamy, Devendra Goyal, Nikhil PG, K.R. Kapoor
article en
1 citations

Abstract

The paper presents the reliability study on field-aged photovoltaic connectors of different makes characterized by diverse climatic conditions with 2 to 10 years of operational life. A series of tests conforming to IEC 62852 conducted on field-aged connectors and control samples. The objective is to elucidate the mechanisms of aging and evaluate reliability of connectors, identify failure modes, potential hazards, changes in electrical and mechanical performance because of longstanding exposure to environmental and operational stresses. Field survey and testing reveal lack of awareness of workmanship and maintenance. Laboratory testing reveals connector less than 6 years of life shows low contact resistance and remain stable or have marginal linear increase after thermal and damp heat testing. Samples with life of 6 years or more from extreme climatic regions show high contact resistance with nonlinear pattern increasing to 300% in the thermal cycle and up to 600% in damp heat test. In SEM fretting was observed with high contact resistance with marginal polymer deterioration

Eksploatacja i Niezawodnosc - Maintenance and Reliability
Openalex Percentile: Top 45%
Integrated Circuits and Semiconductor Failure Analysis
0.21
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.