Transmission Electron Microscopy of InGaAs/GaAs Quantum Dots Grown in a Bi Vapor Flow

Transmission electron microscopy is used to study the formation of InGaAs/GaAs quantum dots by molecular beam epitaxy under the influence of a Bi vapor flow on the growth surface at different temperatures of the GaAs substrate. Mixed-dimensional nanostructures (0D/2D) are found. Energy-dispersive X-ray spectroscopy demonstrates that Bi acts as a surfactant and is not trapped by the growing layers.

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Publication Details

Journal
Bulletin of the Lebedev Physics Institute
Published
2024-11-01
DOI
https://doi.org/10.3103/s1068335624601067
Primary Topic
Semiconductor Quantum Structures and Devices
Type
article
Field-Weighted Citation Impact
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article

Transmission Electron Microscopy of InGaAs/GaAs Quantum Dots Grown in a Bi Vapor Flow

I. N. Trunkin, И. П. Казаков
Bulletin of the Lebedev Physics Institute
Semiconductor Quantum Structures and Devices
article

Transmission Electron Microscopy of InGaAs/GaAs Quantum Dots Grown in a Bi Vapor Flow

I. N. Trunkin, И. П. Казаков
article en

Abstract

Transmission electron microscopy is used to study the formation of InGaAs/GaAs quantum dots by molecular beam epitaxy under the influence of a Bi vapor flow on the growth surface at different temperatures of the GaAs substrate. Mixed-dimensional nanostructures (0D/2D) are found. Energy-dispersive X-ray spectroscopy demonstrates that Bi acts as a surfactant and is not trapped by the growing layers.

Bulletin of the Lebedev Physics InstituteVol. 51(11)
P.N. Lebedev Physical Institute of the Russian Academy of Sciences (RU), Kurchatov Institute (RU)
Affordable and clean energy
Openalex Percentile: Top 78%
Semiconductor Quantum Structures and Devices
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