Simulation framework for electrical impedance Tomography systems

Electrical Impedance Tomography (EIT) is a promising approach for monitoring chemical processes and deriving process quantities. These insights then can be used for optimal control of the process. The EIT hardware must be optimized for the specific requirements of the chemical reaction and its environment. Further influences come from the image reconstruction algorithms, which in turn are optimized for the process itself. This requires a large amount of data to be captured. We employ a hybrid approach using SPICE and COMSOL. Combining these methods we built a framework that is capable of generating simulated EIT data of a real world system enabling hardware optimization as well as algorithm optimization. COMSOL is utilized to fit equivalent circuit models to the object under study, while SPICE simulates the output signal with noise introduced by discrete hardware components. The simulation serves as a digital twin of a real system with which the generated signals are cross-validated. With this framework, we are able to simulate data, reconstruct realistic images, and optimize for any custom-made system effectively.