Enhancing Lot Sentencing Through a Capability Index‐Based Skip‐Lot Sampling Scheme

ABSTRACT An acceptance sampling plan (ASP) is a commonly used tool in quality assurance that allows business partners to make decisions about lot disposition. To enhance the efficiency and applicability of inspection, various ASPs have been constructed to meet different circumstances in practical applications. One of these ASPs is the skip‐lot sampling plan (SkSP), which reduces inspection time and cost for a series of product lots from a supplier with excellent quality records. Based on the structure of the SkSP, we propose an improved variables SkSP that uses a repetitive group sampling (RGS) plan based on the most commonly used capability index C pk as the reference plan, designated as C pk ‐based SkSP‐RGS. This plan is optimized using a model that ensures the operating characteristic function meets a two‐point condition and minimizes the average sample number (ASN). Additionally, two main performance measures of sampling plans, ASN and discriminatory power, are investigated. The results reveal the superiority of the proposed plan over conventional C pk ‐based sampling plans. Lastly, a case study from the liquid crystal module industry is demonstrated using the proposed plan to show its applicability and practicality.