Plasma Processes for Vertical Niobium Nitride Superconducting Through Silicon Vias

Superconducting through silicon vias are emerging as a key interconnect technology to realise a scalable superconducting quantum computing platform. Integration of semiconductor technology into quantum devices is becoming more common whilst quantum devices are taking advantage of novel combinations of plasma processes and materials to realise more qubits and denser integration. In this letter, plasma processes for fabrication of superconducting niobium nitride TSVs have been developed by means of deep silicon etching, plasma polishing and atomic layer deposition. Key steps were experimentally investigated for their impact on etching and deposition results. The underlying mechanisms have been analysed to optimise the whole process flow. Sidewall topography significantly influenced conformality of niobium nitride deposition into deep features. As a result, high-quality vertical superconducting through silicon vias were obtained with a transition temperature of 10.7 K.

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Publication Details

Journal
IEEE Electron Device Letters
Published
2024-12-24
DOI
https://doi.org/10.1109/led.2024.3522184
Citations
1
Primary Topic
Metal and Thin Film Mechanics
Type
article
Field-Weighted Citation Impact
0.27

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article

Plasma Processes for Vertical Niobium Nitride Superconducting Through Silicon Vias

Robert H. Hadfield, Russ Renzas, Zhong Ren, Ciaran T. Lennon et al.
1 citations
IEEE Electron Device Letters
Metal and Thin Film Mechanics
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article

Plasma Processes for Vertical Niobium Nitride Superconducting Through Silicon Vias

Robert H. Hadfield, Russ Renzas, Zhong Ren, Ciaran T. Lennon, Mike Cooke, Harm C. M. Knoops, Yi Shu
article en
1 citations

Abstract

Superconducting through silicon vias are emerging as a key interconnect technology to realise a scalable superconducting quantum computing platform. Integration of semiconductor technology into quantum devices is becoming more common whilst quantum devices are taking advantage of novel combinations of plasma processes and materials to realise more qubits and denser integration. In this letter, plasma processes for fabrication of superconducting niobium nitride TSVs have been developed by means of deep silicon etching, plasma polishing and atomic layer deposition. Key steps were experimentally investigated for their impact on etching and deposition results. The underlying mechanisms have been analysed to optimise the whole process flow. Sidewall topography significantly influenced conformality of niobium nitride deposition into deep features. As a result, high-quality vertical superconducting through silicon vias were obtained with a transition temperature of 10.7 K.

IEEE Electron Device LettersVol. 46(2)
Oxford Instruments (United Kingdom) (GB), University of Glasgow (GB)
Engineering and Physical Sciences Research Council
Openalex Percentile: Top 46%
Metal and Thin Film Mechanics
0.27
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Plasma Processes for Vertical Niobium Nitride Superconducting Through Silicon Vias — Robert H. Hadfield, Russ Renzas, et al. · IEEE Electron Device Letters (2024) | TGRS Research Map | TGRS