High-quality AlN regrown on high-temperature-annealing templates with thermal cleaning
Abstract High-temperature-annealing AlN (HTA-AlN) templates have a large number of Al x O y N z islands which roughen the surface and affect the following regrowth. To achieve smooth and high-quality regrown AlN films, various surface cleaning technologies for HTA-AlN templates were investigated. Conventional alkaline or acidic chemical cleaning has a poor effect on improving the surface of HTA-AlN templates and many V-pits appeared on the regrown-AlN surface. On the other hand, thermal cleaning could remove Al x O y N z islands adequately and thus improve surface morphology. Furthermore, the regrown-AlN layer after thermal cleaning has less than 0.2 nm roughness without any surface defects and maintains high crystallinity as the HTA-AlN templates. This study provides a convenient and effective method for cleaning the HTA-AlN templates, which can be used in the industrialization of AlGaN-based devices.
Authors
- Jinmin Li (ORCID: https://orcid.org/0000-0002-0900-2497)
- Jianchang Yan (ORCID: https://orcid.org/0000-0002-7026-1711)
- Yanan Guo (ORCID: https://orcid.org/0000-0003-0754-2913)
- Junxi Wang (ORCID: https://orcid.org/0000-0002-8283-5540)
- Dadi Wang (ORCID: https://orcid.org/0000-0001-5255-0483)
- Z. Liu (ORCID: https://orcid.org/0009-0004-3023-1085)
Institutions
- Chinese Academy of Sciences (CN)
- Institute of Semiconductors (CN)
Publication Details
- Journal
- Japanese Journal of Applied Physics
- Published
- 2024-12-24
- DOI
- https://doi.org/10.35848/1347-4065/ada334
- Citations
- 2
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.62
Funders
- National Natural Science Foundation of China
- Youth Innovation Promotion Association of the Chinese Academy of Sciences
- National Key Research and Development Program of China
- Shanxi Provincial Key Research and Development Project