High-quality AlN regrown on high-temperature-annealing templates with thermal cleaning

Abstract High-temperature-annealing AlN (HTA-AlN) templates have a large number of Al x O y N z islands which roughen the surface and affect the following regrowth. To achieve smooth and high-quality regrown AlN films, various surface cleaning technologies for HTA-AlN templates were investigated. Conventional alkaline or acidic chemical cleaning has a poor effect on improving the surface of HTA-AlN templates and many V-pits appeared on the regrown-AlN surface. On the other hand, thermal cleaning could remove Al x O y N z islands adequately and thus improve surface morphology. Furthermore, the regrown-AlN layer after thermal cleaning has less than 0.2 nm roughness without any surface defects and maintains high crystallinity as the HTA-AlN templates. This study provides a convenient and effective method for cleaning the HTA-AlN templates, which can be used in the industrialization of AlGaN-based devices.

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Publication Details

Journal
Japanese Journal of Applied Physics
Published
2024-12-24
DOI
https://doi.org/10.35848/1347-4065/ada334
Citations
2
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
0.62

Funders

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article

High-quality AlN regrown on high-temperature-annealing templates with thermal cleaning

Jinmin Li, Jianchang Yan, Yanan Guo, Junxi Wang et al.
2 citations
Japanese Journal of Applied Physics
GaN-based semiconductor devices and materials
0.62
article

High-quality AlN regrown on high-temperature-annealing templates with thermal cleaning

Jinmin Li, Jianchang Yan, Yanan Guo, Junxi Wang, Dadi Wang, Z. Liu
article en
2 citations

Abstract

Abstract High-temperature-annealing AlN (HTA-AlN) templates have a large number of Al x O y N z islands which roughen the surface and affect the following regrowth. To achieve smooth and high-quality regrown AlN films, various surface cleaning technologies for HTA-AlN templates were investigated. Conventional alkaline or acidic chemical cleaning has a poor effect on improving the surface of HTA-AlN templates and many V-pits appeared on the regrown-AlN surface. On the other hand, thermal cleaning could remove Al x O y N z islands adequately and thus improve surface morphology. Furthermore, the regrown-AlN layer after thermal cleaning has less than 0.2 nm roughness without any surface defects and maintains high crystallinity as the HTA-AlN templates. This study provides a convenient and effective method for cleaning the HTA-AlN templates, which can be used in the industrialization of AlGaN-based devices.

Japanese Journal of Applied PhysicsVol. 64(1)
Chinese Academy of Sciences (CN), Institute of Semiconductors (CN)
National Natural Science Foundation of China, Youth Innovation Promotion Association of the Chinese Academy of Sciences, National Key Research and Development Program of China, Shanxi Provincial Key Research and Development Project
Industry, innovation and infrastructure
Openalex Percentile: Top 31%
GaN-based semiconductor devices and materials
0.62
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High-quality AlN regrown on high-temperature-annealing templates with thermal cleaning — Jinmin Li, Jianchang Yan, et al. · Japanese Journal of Applied Physics (2024) | TGRS Research Map | TGRS