Wavefront aberration measurements based on the Background Oriented Schlieren method

Applications based on neural networks tend to be very sensitive to dataset shifts. Hence, the perception chain for autonomous driving is safeguarded against perturbations by imposing exaggerated optical quality requirements. Due to the non-linear coupling of optical elements, system requirements of camera-based Advanced Driver Assistance Systems (ADAS) can not be easily decomposed into individual part tolerances of the objective lens and the windscreen. This holds true for intensity-based part measurements, e.g. slanted edge measurements according to ISO12233, which can fundamentally not capture interference effects of the complex light field. Instead wavefront-based part measurements are required. Unfortunately, state-of-the-art wavefront measurement techniques are limited by the spanned sensitive area of the Shack-Hartmann lenslet array or the aperture stop of a corresponding interferometrical setup, respectively. Further, both measurements are limited by using collimated light only, whereas the target application has a large (angular) field of view, requiring many different measurements. We address those bottlenecks by proposing a novel wavefront aberration measurement procedure based on the Background Oriented Schlieren (BOS) method utilizing image auto-correlation. We analytically derive the governing equations for determining the Zernike coefficients of a wavefront aberration map in the knowledge of the local refractive power map obtained by a high-resolution BOS measurement. Furthermore, we experimentally demonstrate the feasibility of the measurement technique. Applying this novel method yields the promise of affordable wavefront aberration measurements only requiring a high-resolution camera and a sophisticated alignment strategy.

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Publication Details

Journal
Measurement Sensors
Published
2024-12-24
DOI
https://doi.org/10.1016/j.measen.2024.101509
Primary Topic
Optical measurement and interference techniques
Type
article
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article

Wavefront aberration measurements based on the Background Oriented Schlieren method

Alexander Braun, Markus Ulrich, Dominik Werner Wolf, Boris Thielbeer
Measurement Sensors
Optical measurement and interference techniques
article

Wavefront aberration measurements based on the Background Oriented Schlieren method

Alexander Braun, Markus Ulrich, Dominik Werner Wolf, Boris Thielbeer
article en

Abstract

Applications based on neural networks tend to be very sensitive to dataset shifts. Hence, the perception chain for autonomous driving is safeguarded against perturbations by imposing exaggerated optical quality requirements. Due to the non-linear coupling of optical elements, system requirements of camera-based Advanced Driver Assistance Systems (ADAS) can not be easily decomposed into individual part tolerances of the objective lens and the windscreen. This holds true for intensity-based part measurements, e.g. slanted edge measurements according to ISO12233, which can fundamentally not capture interference effects of the complex light field. Instead wavefront-based part measurements are required. Unfortunately, state-of-the-art wavefront measurement techniques are limited by the spanned sensitive area of the Shack-Hartmann lenslet array or the aperture stop of a corresponding interferometrical setup, respectively. Further, both measurements are limited by using collimated light only, whereas the target application has a large (angular) field of view, requiring many different measurements. We address those bottlenecks by proposing a novel wavefront aberration measurement procedure based on the Background Oriented Schlieren (BOS) method utilizing image auto-correlation. We analytically derive the governing equations for determining the Zernike coefficients of a wavefront aberration map in the knowledge of the local refractive power map obtained by a high-resolution BOS measurement. Furthermore, we experimentally demonstrate the feasibility of the measurement technique. Applying this novel method yields the promise of affordable wavefront aberration measurements only requiring a high-resolution camera and a sophisticated alignment strategy.

Measurement SensorsVol. 38
Karlsruhe Institute of Technology (DE), Volkswagen Group (Germany) (DE), Hochschule Düsseldorf University of Applied Sciences (DE)
Reduced inequalities
Openalex Percentile: Top 76%
Optical measurement and interference techniques
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