Rapid modulation bandwidth test system of micro-LED based on photon excitation

Modulation bandwidth is essential for micro-LED in visible light communication systems. The traditional electroluminescence-based bandwidth test system (EL-BW-Test) is time-consuming and inevitably causes irreversible damage. This paper introduces the design and construction of a novel, to the best of our knowledge, photon-excited bandwidth testing system (PL-BW-Test), capable of swiftly acquiring the bandwidth of LED epi-wafers and devices. Comparison and experimental results demonstrated that the LED bandwidth measurements obtained via PL-BW-Test exhibit consistency with those acquired through EL-BW-Test, particularly concerning the excitation intensity and quantum well structure. The newly invented system presents several advantages including easy operation, broad applicability, and non-destructiveness, offering an innovative approach to an efficient, non-contact modulation bandwidth measurement.

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Publication Details

Journal
Optics Letters
Published
2024-12-24
DOI
https://doi.org/10.1364/ol.547276
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
0.00

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article

Rapid modulation bandwidth test system of micro-LED based on photon excitation

Ting Zhi, Hui Jin, Yan Hong, Zhe Zhuang et al.
Optics Letters
GaN-based semiconductor devices and materials
article

Rapid modulation bandwidth test system of micro-LED based on photon excitation

Ting Zhi, Hui Jin, Yan Hong, Zhe Zhuang, Rongrong Dou, Feifan Xu, Wengang Bi, Tao Tao, Wenjuan Chen, Zili Xie, Yan Yu, Qian Niu, Cheng Qu, Bin Liu
article en

Abstract

Modulation bandwidth is essential for micro-LED in visible light communication systems. The traditional electroluminescence-based bandwidth test system (EL-BW-Test) is time-consuming and inevitably causes irreversible damage. This paper introduces the design and construction of a novel, to the best of our knowledge, photon-excited bandwidth testing system (PL-BW-Test), capable of swiftly acquiring the bandwidth of LED epi-wafers and devices. Comparison and experimental results demonstrated that the LED bandwidth measurements obtained via PL-BW-Test exhibit consistency with those acquired through EL-BW-Test, particularly concerning the excitation intensity and quantum well structure. The newly invented system presents several advantages including easy operation, broad applicability, and non-destructiveness, offering an innovative approach to an efficient, non-contact modulation bandwidth measurement.

Optics LettersVol. 50(3)
Chinese University of Hong Kong (HK), Japan Display (Japan) (JP), Nanjing University of Posts and Telecommunications (CN), Nanjing University (CN)
National Natural Science Foundation of China, Natural Science Foundation of Jiangsu Province, National Key Research and Development Program of China
Affordable and clean energy
Openalex Percentile: Top 85%
GaN-based semiconductor devices and materials
DOISourceOpenAlex
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