Fast Method for the Measurement of Dispersion of Integrated Waveguides by Utilizing Michelson Interferometry Effects

In this paper we demonstrate a new approach to the measurement of dispersion of light reflected in integrated optical devices. The approach utilizes the fact that light reflected from the end facet of an integrated waveguide will interfere with light reflected from points inside the device under test (DUT), effectively creating a Michelson interferometer. The distance between the measured fringes of this interferometric signal will depend directly on the group delay experienced in the device under test, allowing for fast and easy measurement of waveguide dispersion. This approach has been used to determine the dispersion of a fabricated linearly chirped Bragg gratings waveguide and the result agrees well with the designed value.