High-resolution electron microscopy imaging of MOFs at optimized electron dose
Electron dose thresholds were analyzed for pristine and metalated PCN-222 MOFs. RiCOM images from low-dose 4D-STEM experiment data sets, reveal structural details, allowing investigation of local features while minimizing beam-induced damage.
Authors
- Johan Verbeeck (ORCID: https://orcid.org/0000-0002-7151-8101)
- Sara Bals (ORCID: https://orcid.org/0000-0002-4249-8017)
- Daen Jannis (ORCID: https://orcid.org/0000-0003-0285-0511)
- Annick De Backer (ORCID: https://orcid.org/0000-0002-8592-4776)
- Sergio Carrasco (ORCID: https://orcid.org/0000-0003-0024-1392)
- Safiyye Kavak (ORCID: https://orcid.org/0000-0002-3910-5737)
- Daniel Arenas Esteban (ORCID: https://orcid.org/0000-0002-5626-9848)
- Sandra Van Aert (ORCID: https://orcid.org/0000-0001-9603-8764)
- Patricia Horcajada (ORCID: https://orcid.org/0000-0002-6544-5911)
- Arno Annys (ORCID: https://orcid.org/0009-0005-7599-6900)
- Raul Mulero
- Javier Ferrando (ORCID: https://orcid.org/0000-0002-1007-7816)
Institutions
- University of Antwerp (BE)
- IMDEA Energy Institute (ES)
Publication Details
- Journal
- Journal of Materials Chemistry A
- Published
- 2024-12-23
- DOI
- https://doi.org/10.1039/d4ta06724j
- Citations
- 7
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 1.25