Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

To tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as glass, we developed a carry-in diffractometer to utilise X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element-specific analyses with atomic resolution using the wavelength tunability of a synchrotron X-ray source. Our diffractometer unifies XFH and AXS configurations to determine the crystal orientation via diffractometry. In particular, XFH was realised even for a crystal with blurred emission lines by a standing wave in a hologram, and high-throughput AXS with sufficient count statistics and energy resolution was achieved using three multi-array detectors with crystal analysers. These features increase tractable targets by XFH and AXS, which have novel functionalities.

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Publication Details

Journal
Journal of Synchrotron Radiation
Published
2024-12-20
DOI
https://doi.org/10.1107/s1600577524011366
Citations
6
Primary Topic
Particle physics theoretical and experimental studies
Type
article
Field-Weighted Citation Impact
3.96

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Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

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Journal of Synchrotron Radiation
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article

Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

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article en
6 citations

Abstract

To tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as glass, we developed a carry-in diffractometer to utilise X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element-specific analyses with atomic resolution using the wavelength tunability of a synchrotron X-ray source. Our diffractometer unifies XFH and AXS configurations to determine the crystal orientation via diffractometry. In particular, XFH was realised even for a crystal with blurred emission lines by a standing wave in a hologram, and high-throughput AXS with sufficient count statistics and energy resolution was achieved using three multi-array detectors with crystal analysers. These features increase tractable targets by XFH and AXS, which have novel functionalities.

Journal of Synchrotron RadiationVol. 32(1)
Shimane University (JP), Nagoya Institute of Technology (JP), National Institute for Materials Science (JP), Japan Synchrotron Radiation Research Institute (JP), Hiroshima City University (JP), The University of Tokyo (JP), Zhejiang University (CN)
Japan Society for the Promotion of Science
Affordable and clean energy
Openalex Percentile: Top 5%
Particle physics theoretical and experimental studies
3.96
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