ESTIMATION OF THE PENETRATED ELECTRIC FIELD INSIDE A HUMAN HEAD DUE TO EXPOSURE TO ELECTROMAGNETIC RADIATION OF A MOBILE PHONE

The main aim of this study is the estimation of electric field strength induced inside a human head due to exposure to the electromagnetic radiation of a mobile phone. Numerical calculations are performed using a frequency of 2600 MHz, characteristic of 4G mobile communication networks. Realistic 3D models of the mobile phone, the user’s head and an actual smart phone have been created. The head is modeled as a highly non-homogeneous structure containing sixteen homogeneous domains of electromagnetic parameters taken from literature. Our results show that the values of the electric field strength are the highest in the layer nearest to the outer surface of the head.