Formulation for multiple reflection in silicon waveguide observed in OFDR depth profile
The multiple reflection with longer travel distance than waveguide length was formulated. It was confirmed that the developed formulation well reproduces the observed OFDR profiles for silicon waveguides, and the strong positive correlation between the propagation loss and reflection coefficient extracted.
Authors
- Nobuhiko Nishiyama (ORCID: https://orcid.org/0000-0001-8288-6690)
- Tsuyoshi Horikawa (ORCID: https://orcid.org/0000-0002-0084-0654)
- Masanori Yatani
- Atsushi Kitamura
Institutions
- Tokyo Institute of Technology (JP)
- Santen (Japan) (JP)
Publication Details
- Published
- 2024-11-10
- DOI
- https://doi.org/10.1109/ipc60965.2024.10799811
- Citations
- 1
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.21
Funders
- Technology Development