A Dynamic Two-Stage Gate Driver for Unlocking the Fast-Switching Potential of GaN HEMT

The gate terminal of mainstream Schottky-type p-GaN gate high-electron-mobility transistor (HEMT) is particularly vulnerable to the gate voltage ringing during the fast-switching transient due to its narrow gate voltage headroom for safe operation. In this work, a new gate driver circuit with expanded gate voltage headroom and suppressed gate-loop oscillation/ringing is proposed. The new design is based on a dynamic two-stage turn-<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> process enabled by a GaN lateral field-effect rectifier (L-FER)-resistor pair that can self-adaptively adjust the gate charging speed according to the real-time gate voltage, enabling fast charging during the initial turn-<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> stage and slow charging when the gate is near complete turn <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small>. The latter stage effectively suppresses the gate-loop oscillation to enable an elevated gate turn-<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> voltage for a stronger yet safe gate overdrive to suppress the dynamic <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ON</sub> degradation in the GaN HEMT. Such a dynamic two-stage gate voltage profile can be realized without additional active sensing or control. The GaN L-FER is implemented with a low-voltage GaN HEMT in the diode mode that is free of reverse recovery issues. Equipped with this dynamic two-stage gate driver, the fast-switching potential of the GaN HEMT can be fully unlocked to reduce the switching loss without gate overstress; meanwhile, the switching oscillation can also be suppressed significantly.

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Publication Details

Journal
IEEE Transactions on Power Electronics
Published
2024-12-20
DOI
https://doi.org/10.1109/tpel.2024.3520671
Citations
6
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
1.87
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article

A Dynamic Two-Stage Gate Driver for Unlocking the Fast-Switching Potential of GaN HEMT

Xinke Wu, Ji Shu, Jiahui Sun, Kevin J. Chen
6 citations
IEEE Transactions on Power Electronics
GaN-based semiconductor devices and materials
1.87
article

A Dynamic Two-Stage Gate Driver for Unlocking the Fast-Switching Potential of GaN HEMT

Xinke Wu, Ji Shu, Jiahui Sun, Kevin J. Chen
article en
6 citations

Abstract

The gate terminal of mainstream Schottky-type p-GaN gate high-electron-mobility transistor (HEMT) is particularly vulnerable to the gate voltage ringing during the fast-switching transient due to its narrow gate voltage headroom for safe operation. In this work, a new gate driver circuit with expanded gate voltage headroom and suppressed gate-loop oscillation/ringing is proposed. The new design is based on a dynamic two-stage turn-<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> process enabled by a GaN lateral field-effect rectifier (L-FER)-resistor pair that can self-adaptively adjust the gate charging speed according to the real-time gate voltage, enabling fast charging during the initial turn-<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> stage and slow charging when the gate is near complete turn <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small>. The latter stage effectively suppresses the gate-loop oscillation to enable an elevated gate turn-<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> voltage for a stronger yet safe gate overdrive to suppress the dynamic <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ON</sub> degradation in the GaN HEMT. Such a dynamic two-stage gate voltage profile can be realized without additional active sensing or control. The GaN L-FER is implemented with a low-voltage GaN HEMT in the diode mode that is free of reverse recovery issues. Equipped with this dynamic two-stage gate driver, the fast-switching potential of the GaN HEMT can be fully unlocked to reduce the switching loss without gate overstress; meanwhile, the switching oscillation can also be suppressed significantly.

IEEE Transactions on Power ElectronicsVol. 40(4)
Hong Kong University of Science and Technology (HK), Zhejiang University (CN)
Openalex Percentile: Top 14%
GaN-based semiconductor devices and materials
1.87
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