Real-time detection and auto-focusing of beam profiles from silicon photonics gratings using the YOLO model
When observing chip-to-free-space light beams from silicon photonics (SiPh) to free space, manual adjustment of camera lens is often required to obtain a focused image of the light beams. In this Letter, we demonstrated an auto-focusing system based on the you-only-look-once (YOLO) model. The trained YOLO model exhibits high classification accuracy of 99.7% and high confidence level of >0.95 when detecting light beams from SiPh gratings. A video demonstration of real-time light beam detection, real-time computation of beam widths, and auto-focusing of light beams is also included.
Authors
- Simon Chun Kiat Goh (ORCID: https://orcid.org/0000-0002-6833-2920)
- Chuan Seng Tan (ORCID: https://orcid.org/0000-0003-1250-9165)
- Xiangyu Wang (ORCID: https://orcid.org/0000-0001-8718-6941)
- Hongyu Li (ORCID: https://orcid.org/0000-0001-8223-190X)
- Peng Zhao (ORCID: https://orcid.org/0009-0001-9742-332X)
- Yu Dian Lim (ORCID: https://orcid.org/0000-0003-4188-997X)
Institutions
- Agency for Science, Technology and Research (SG)
- Samsung (South Korea) (KR)
- Star Technology and Research (United States) (US)
Publication Details
- Journal
- Optics Letters
- Published
- 2024-12-20
- DOI
- https://doi.org/10.1364/ol.543160
- Citations
- 3
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.63
Funders
- Agency for Science, Technology and Research
- National Research Foundation Singapore
- Ministry of Education - Singapore