Comparing Sweep Rate Effects for Different Perovskite Technologies

Perovskite solar cell devices – although thought to be possible candidates for substituting conventional silicon photovoltaics – display inherent instabilities that complicate the application of traditional characterisation approaches. Hence, conducting measurements for different technologies under varying conditions can help in characterising them as well as contributing to the advancement of their stability needed for commercial success. This work aims to contribute to the growing body of indoor tests aimed at enhancing the understanding and characterisation of this novel technology. Four different types of perovskite technology mini-modules have been tested with different sweep rates to study its impact on the hysteresis effect noticed during full scan current-voltage (I-V) traces. Measurements revealed that the MAPbI<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> perovskite-based devices are more sensitive to sweep rate than the CsFAPbIBr perovskites. The changes noticed in the I-V traces at different sweep rates is thought to be due to different ion migration effects in the perovskite, so finding the appropriate sweep rate for each technology will lead to a better characterisation of these samples.