Characterization and Degradation of perovskite mini-modules

A holistic approach was utilized in this work to characterize perovskite mini-modules. Outdoor testing in combination with advanced optoelectronic techniques (spatially resolved Electroluminescence/Photoluminescence) were applied for the testing of the devices. In this way, investigation of the power output evolution of the devices in the field as well as study of their defects and shunts evolution will be performed. A considerable reduction of the power output was obtained from the devices exposed outdoors from the first days of testing. Moreover, reference modules of the same structure were kept indoors in dark storage and measured regularly with means of IV and spatially-resolved EL/PL for the study of their performance degradation under dark and controlled conditions indoors.