Fully-Vertical GaN-on-SiC Trench MOSFETs

This letter presents the first demonstration of fully-vertical GaN-on-SiC trench MOSFETs enabled by a conductive AlGaN buffer. Good ON-state device performance including a maximum drain current density of 2.43 kA/cm2 and a high threshold voltage of 5 V has been demonstrated. The relatively high specific ON-resistance at low <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${\boldsymbol {V}}_{\text {DS}}$ </tex-math></inline-formula> is a result of a knee voltage induced by the yet to be optimized AlGaN/SiC heterojunction. A breakdown voltage of 334 V has been measured. Compared with quasi-vertical GaN-on-silicon trench MOSFETs, less current crowding effect is observed for fully-vertical GaN-on-SiC trench MOSFETs, as well as a better performance at elevated temperatures.

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Publication Details

Journal
IEEE Electron Device Letters
Published
2024-12-19
DOI
https://doi.org/10.1109/led.2024.3520200
Citations
7
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
2.18
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article

Fully-Vertical GaN-on-SiC Trench MOSFETs

Renqiang Zhu, Kei May Lau, Ka Ming Wong, Jialun Li
7 citations
IEEE Electron Device Letters
GaN-based semiconductor devices and materials
2.18
article

Fully-Vertical GaN-on-SiC Trench MOSFETs

Renqiang Zhu, Kei May Lau, Ka Ming Wong, Jialun Li
article en
7 citations

Abstract

This letter presents the first demonstration of fully-vertical GaN-on-SiC trench MOSFETs enabled by a conductive AlGaN buffer. Good ON-state device performance including a maximum drain current density of 2.43 kA/cm2 and a high threshold voltage of 5 V has been demonstrated. The relatively high specific ON-resistance at low <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${\boldsymbol {V}}_{\text {DS}}$ </tex-math></inline-formula> is a result of a knee voltage induced by the yet to be optimized AlGaN/SiC heterojunction. A breakdown voltage of 334 V has been measured. Compared with quasi-vertical GaN-on-silicon trench MOSFETs, less current crowding effect is observed for fully-vertical GaN-on-SiC trench MOSFETs, as well as a better performance at elevated temperatures.

IEEE Electron Device LettersVol. 46(2)
Hong Kong University of Science and Technology (HK), University of Hong Kong (HK)
Openalex Percentile: Top 12%
GaN-based semiconductor devices and materials
2.18
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